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1. LF: FETs failing (score: 1): Author: "Alan Melia" <[email protected]>; Date: Mon, 28 Oct 2002 14:11:09 +0100; Hi All, Jim has raised an interesting point about low current testing which probably applies to BJT RF devices as well in some cases. A lot of these devices consist of several small fets (or smaller; /rsgb_lf_group-archives/html/rsgb_lf_group/2002-10/msg00060.html (8,003 bytes)

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